Here are a few reasons whyProcess Insights Analytical Solutionsare important to your process optimization and safety:
Gas analyzers are used in academic and advanced research labs for a variety of reasons. Some of the most common reasons include:
Our CRDS analyzers that are commonly used in this field include:
Our Quadrupole Mass Spectrometers that are commonly used in this field include:
Materials and Catalysis Research often use gas analyzers for a variety of purposes:
OurCRDS Gas Analyzersthat are used in this field include:
OurQuadrupole Mass Spectrometersare widely used in Materials and Catalysis Research for gas analysis include:
Gas analyzers can be used in laser ablation experiments to monitor the chemical composition of the ablated material and the surrounding gas environment. In a typical laser ablation experiment, a focused laser beam is used to vaporize a small amount of material from the surface of a solid sample. The resulting plume of vaporized material expands rapidly, creating a gas environment that can be analyzed using gas analyzers.
To use gas analyzers for laser ablation, the instrument is typically positioned near the ablation spot to monitor the gas environment in real-time. The gas analyzer may be used to measure a range of parameters, including the concentration of various gases, such as oxygen, nitrogen, and carbon dioxide. This information can then be used to gain insights into the laser ablation process, including the efficiency of material removal, the composition of the ablated material, and the formation of various reaction products.
Laser ablation is used in a variety of applications, including:
For example, ourQuadrupole Mass Spectrometerscan be used to monitor the composition of the gas environment during laser ablation experiments to determine the presence and concentration of specific gases, such as oxygen, nitrogen, and carbon dioxide. This information can be used to gain insights into the laser ablation process and the composition of the ablated material.
They also be used to analyze the ablated material directly. In this case, the ablated material is ionized by the laser, and the resulting ions are analyzed by the mass spectrometer to determine the elemental composition of the ablated material. This information can be used to gain insights into the material properties and the efficiency of the laser ablation process.
Outgassing studies are investigations into the release of volatile substances, such as gases or vapors, from a material or system under vacuum conditions. When a material is placed in a vacuum, the reduced pressure can cause trapped gases or other volatile substances within the material to be released, a process known as outgassing. This can be a concern in a variety of applications, including space exploration, semiconductor manufacturing, and vacuum coating processes.
Analysts useOutgassing Studiesto determine the chemical and physical properties of materials that are under various temperature and pressure conditions. Outgassing research analyzes materials used in the production of Aerospace and Semiconductor devices. This application is also well-suited to analyze devices such as Medical/Surgical Equipment, Automotive Parts and High Precision Ceramics, where high quality results are critical for successful research studies.
To perform Outgassing Studies, Mass Spectrometers that provide high sensitivity and high resolution are needed. OurEXTREL™MAX-QMS™Mass Spectrometer System meets these needs. Along with high sensitivity up to 6 mA/Torr, the MAX-QMS System gives users the ability to measure both water and other possible contaminants. The Merlin Automation™ Data System provides the user with the ability to monitor outgassing during a short experiment, continuously for days or even weeks.
Secondary ion mass spectrometry (SIMS) is an analytical technique used to analyze the chemical composition of solid surfaces and thin films at the atomic and molecular scale. In SIMS, a beam of high-energy ions is directed at a sample, causing the ejection of secondary ions from the surface of the sample. These secondary ions are then analyzed using a mass spectrometer to determine their chemical identity and abundance.
Helium scattering is a surface analysis technique that is used to study the properties of surfaces at the atomic and molecular scale. In helium scattering, a beam of helium atoms is directed at a surface, and the scattering of the helium atoms is measured to obtain information about the surface structure and composition.
氦原子散射的基本原理是,when helium atoms collide with a surface, they are scattered in a predictable pattern that is determined by the properties of the surface. By measuring the angle and energy distribution of the scattered helium atoms, researchers can determine properties such as surface roughness, surface coverage, and the spacing and arrangement of surface atoms.
One technique used to characterize the physical and electronic properties of the surface of a material isHelium Scatteringusing mass spectrometry. A beam of atoms, usually Helium, is aimed at a surface, and atoms from the surface are ejected. Mass Filters are used to measure the atoms that are scattered, and to pinpoint the angle and time at which the scattering atoms are being released (time of flight analysis). Since the events of this non-destructive surface science method happen quickly, this application requires the use of mass filters that provide high stability and fast response times. OurEXTREL™Quadrupole Mass FiltersandRF/DC Power Suppliesare the ideal choice for Scattering applications.
Secondary Ion Mass Spectrometry (SIMS) is a technique used in materials science and analytical chemistry to analyze the composition and distribution of elements and isotopes within a solid sample.Secondary Ion Mass Spectrometry (SIMS)is used to detect and characterize trace elements at or near the surface of a solid or thin film allowing researchers to understand the chemical composition of the surface.
This surface science technique requires the use of systems with very high sensitivity and the ability to perform high resolution energy analysis. SIMS is useful for a wide variety of surface analysis. For example, SIMS can be used to detect and analyze contaminants on a surface, analyze materials and devices to ensure the quality of specific products, and study atomic scale defects that may occur in the manufacturing of semiconductor chips or other materials.
There are several reasons why ourEXTREL™MAX300-RTG™ 2.0mass spectrometeris well-suited for SIMS analysis:
Temperature programmed desorption (TPD) is a surface analysis technique used to study the adsorption and desorption of gases on solid surfaces. TPD involves heating a sample to gradually increase the temperature while monitoring the amount of gas released from the surface. By analyzing the temperature dependence of the desorption, researchers can obtain information about the strength and nature of the adsorption.
TPD requires heating the sample to high temperatures, which can cause some samples to decompose or react with the surrounding atmosphere. This can lead to changes in the sample properties and affect the interpretation of the TPD results. Sample preparation for TPD can be challenging, as the sample needs to be properly cleaned and prepared to ensure that it is free of contaminants that could interfere with the TPD measurements.
OurEXTREL™MAX300-EGAcomes equipped to import a Start-of-Heating signal from the TGA for easy data synchronization and features a chemically inert transfer line specially designed keep the sample hot and under vacuum all the way to the ionizer, to guard against condensation or chemical interaction.
The MAX300-EGA is equipped with a high-performance mass spectrometer that can provide high-resolution mass spectra of desorbed gases during TPD analysis. The system also includes a range of gas handling and temperature control options that allow for precise control of the temperature ramp and gas flow during TPD experiments.
Furthermore, the system is equipped with advanced software that allows for the automated acquisition and analysis of TPD data, as well as the generation of TPD curves and spectra. The software also includes advanced data analysis tools that enable the user to analyze the TPD data in detail and extract meaningful information about the desorption behavior of the molecules on the surface.
纯水在许多实验室里是一个关键的资源ry settings, and is used for a variety of purposes, including:
Ultra-pure water (UPW)is water that has been purified to high levels of specification. Ultra-pure water is essential to every laboratory. UPW must not contain any detectable endotoxins. This level of purity makes it a perfect reagent for laboratory work. UPW is used in the semiconductor and pharmaceutical industries. The quality of water is defined through a series of measurements of conductivity (µS/cm) or resistivity (MΩ-cm),Total Organic Carbon (TOC)in parts per billion (ppb), and bacterial count (CFU/ml).
OurLAR™QuickTOCultra™analyzeruses a high-temperature catalytic combustion method to measure the total organic carbon (TOC) content of ultra-pure water. The analyzer injects a sample of the water into a furnace, where it is oxidized at high temperatures, converting the organic carbon to CO2. The amount of CO2 produced is then measured using a non-dispersive infrared (NDIR) detector, and this is used to determine the TOC content of the water.
This analyzer uses a high-temperature oxidation method to measure the chemical oxygen demand (COD) of ultra-pure water. The analyzer uses a digestion vessel that contains a mixture of sulfuric acid and potassium dichromate. When a sample of the water is added to the vessel, the organic and inorganic compounds in the water are oxidized, releasing CO2. The amount of CO2 produced is then measured using an NDIR detector, and this is used to determine the COD content of the water.
Monitoring wastewater in laboratory and research industries is important for several reasons:
一些常见的参数经常监视laboratory wastewater include:
Laboratories contain significant risks, and the prevention of laboratory accidents requires great care and reliable instrumentation and analytical solutions.Laboratory operations use hazardous chemicals and equipment, which may pose health hazards and physical hazards to laboratory personnel. Gas leaks in the laboratory are often difficult to detect and cause serious consequences. Some risks includeasphyxiation, fire or explosion from compressed gases. The Occupational Exposure to Hazardous Chemicals in Laboratories standard (29 CFR 1910.1450) was created specifically for non-production laboratories.
Cavity Ring-Down Spectroscopy (CRDS) trace gas analyzers are used in laboratories for sensitive and selective detection and quantification of trace gases in gas mixtures. They work by measuring the absorption of light in a resonant cavity, which is coated with a material that selectively absorbs the target gas of interest. CRDS trace gas analyzers are used in a wide range of applications in laboratory settings, including:
A sterilant gas is ethylene oxide gas or hydrogen peroxide that can destroy or inactivate many types of microorganisms.Sterilant gas monitoring is the detection of hazardous gases used by health care and other facilities to sterilize medical supplies that cannot be sterilized by heat or steam methods.Continuous gas analyzers are used as part of thesafety programto provide prompt alerts to nearby workers in the event that there is a leak of the sterilant gas.
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